Profilometer Dektak XT Advanced System

Advanced System (with 3D mapping and stitching) allows measurements of small height differences via scanning of a sample below a needle with a diamant tip (stylus) as line scans.

Device Specifications

Vertical range	6.5 µm / 65.5 µm / 524 µm / 1 mm
Vertical resolution	1 Å @ 6,.5 µm vertical range
Scan length	55 mm (200 mm with stitching)
Horizontal resolution	120.000 points
Stage diameter	6" (15.2 cm)
Stylus force	1-15 mg
Stylus radius	2.5 µm, 5 µm, 12.5 µm, 25 µm
Data transfer	USB