Functionality of Oxide based devices under Electric-field:Towards Atomic-resolution Operando Nanoscopy (FOXON)
Understanding oxygen dynamics is a key to superior device performance in emergent oxide electronics. So far it is an unrealized dream to correlate electrical behavior and atomic structure during device operation. Here, we envision bridging the gap between theoretical models and experimental reality. Recent advances in microelectromechanical systems (MEMS) chips for in situ transmission electron microscopy (TEM) are opening exciting new avenues in nanoscale research. The capability to perform current-voltage measurements while simultaneously analyzing the corresponding structural, chemical or even electronic structure changes during the operation of an electronic device would be a major breakthrough for nanoelectronics. Controlled electric field studies would enable an unprecedented way to investigate metal-oxide functional devices by using a lab-on-a-chip approach.
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