Sample holders are particularly designed for thin film samples but can also be modified for measuring single crystals and sintered polycrystalline samples.
2 out of 5 stages can be evacuated to pressures as low as 10-7 mbar.
We use the setups for:
- in situ Hall-effect and conductivity relaxation measurements for analyzing defect chemistry and oxygen exchange kinetics of transparent conductors, ionic conductors and mixed electronic ionic conductors,
- in-situ Hall-effect measurements with electrochemical sample polarization for studying conductivity and mobility limitations of doped In2O3,
- Activation energy measurements in dependence on oxygen vacancy concentration for the determination of defect energy levels,
- analyzing resistance degradation of high-permittivity dielectrics in dependence on electrode material.
Further facilities are:
- Manual probe station with impedance analyser and semiconductor parameter analyser,
- Low temperature Hall-effect setup with a closed cycle He cryostat,
- Cary UV-VIS spectrometer with Universal Measurement Setup.
