Emerging memory exposed to heavy ion radiation

ACS Nano publication on emerging memory materials and devices

2022/09/28

Reprinted with permission from T. Vogel et al., “Structural and electrical response of emerging memories exposed to heavy ion radiation“, ACS Nano 2022. © 2022 The Authors. Published by American Chemical Society

Two recent works on emerging memory materials exposed to heavy ion radiation were published in ACS Nano and Journal of Applied Physics. These publications have been prepared in close cooperation with CEA LETI and CNRS LTM (Grenoble, France) and Fraunhofer IPMS CNT (Dresden) in the framework of the European Projects WAKeMeUP and StorAIge funded by EU and National Authorities, as well as in close collaboration with the Advanced Electron Microscopy Group of TU Darmstadt and the GSI Helmholtzzentrum für Schwerionenforschung in Darmstadt. The experiments reveal that irradiation-induced effects in hafnium oxide- and GeSbTe-based memory materials strongly depend on the initial crystallinity and composition of the active layers. Our experimental approach combining nonlocal and local characterization with electrical investigations provides important groundwork for investigations of irradiated digital but also analog memristive devices in future.

T. Vogel, A. Zintler, N. Kaiser, N. Guillaume, G. Lefèvre, M. Lederer, A. L. Serra, E. Piros, T. Kim, P. Schreyer, R. Winkler, D. Nasiou, R. R. Olivo, T. Ali, D. Lehninger, A. Arzumanov, C. Charpin-Nicolle, G. Bourgeois, L. Grenouillet, M.-C. Cyrille, G. Navarro, K. Seidel, T. Kämpfe, S. Petzold, C. Trautmann, L. Molina-Luna, L. Alff
Structural and electrical response of emerging memories exposed to heavy ion radiation
ACS Nano (2022)
doi: 10.1021/acsnano.2c04841

M. Lederer, T. Vogel, T. Kämpfe, N. Kaiser, E. Piros, R. Olivo, T. Ali, S. Petzold, D. Lehninger, C. Trautmann, L. Alff, K. Seidel
Heavy ion irradiation induced phase transitions and their impact on the switching behavior of ferroelectric hafnia
Journal of Applied Physics 132, 064102 (2022)
doi: 10.1063/5.0098953

T. Vogel, A. Zintler, N. Kaiser, N. Guillaume, G. Lefèvre, M. Lederer, A. L. Serra, E. Piros, T. Kim, P. Schreyer, R. Winkler, D. Nasiou, R. R. Olivo, T. Ali, D. Lehninger, A. Arzumanov, C. Charpin-Nicolle, G. Bourgeois, L. Grenouillet, MC. Cyrille, G. Navarro, K. Seidel, T. Kämpfe, S. Petzold, C. Trautmann, L. Molina-Luna, L. Alff
Integration of labeled 4D-STEM SPED data for confirmation of phase identification
TUdatalib (2022)
doi: 10.48328/tudatalib-896