The continual advancements in microscopy and spectroscopy, including sample preparation and handling, coupled with in situ/operando techniques and the effective mitigation of electron beam damage through low-dose/high-speed methods, have become essential tools for investigating the structural, chemical, and physical dynamics within materials. Recent breakthroughs in advanced spectroscopy, electron detector, and cryogenic microscopy techniques enable us to observe the structural and chemical dynamics as well as the electronic structure within material interfaces and devices under actual working conditions with high-spatial, high-energy resolution and low electron dose, which are extremely helpful for investigating emerging materials such as 2D materials, battery materials, hybrid materials, and quantum materials. Furthermore, the recently developed data-driven electron microscopy and spectroscopy, leveraging methods such as artificial intelligence and machine learning, holds significant promise in efficiently managing diverse and voluminous data acquisition and analysis. This symposium is focused on advances in FIB-SEM, (S)TEM (4D-STEM, Ptychography, iDPC, et al), spectroscopy, spectrum imaging techniques, and their combinations with in-situ/operando/cryogenic techniques in characterizing materials, interfaces, and devices relevant to energy and functional material sciences.

Topics will include:

• Multi-scale to atomic-resolution imaging and spectroscopy analysis of functional, energy and quantum materials
• In-situ and operando imaging and spectroscopy of materials/devices under operational conditions
• Advanced TEM techniques, including 4D-STEM, Ptychography, Lorentz TEM, Differential Phase Contrast imaging, Electron Holography, Vibrational EELS, Atomic Electron Tomography, and their applications in functional, energy and quantum materials
• Emerging techniques in electron, diffraction, spectroscopy, and their integration with in situ/operando and cryogenic (S)TEM techniques
• Advances in automating in-situ/ex-situ FIB-SEM and S/TEM experiments for data acquisition and analysis using advanced artificial intelligence and machine learning methods
• Development of emerging sample preparation and handling methods that maintain sample integrity from various environmental and ions/electron probes.

Invited Speakers:

• Ismail Baggari (Harvard University, USA)
• MiaoFang Chi (Oak Ridge National Laboratory, USA)
• Kai He (University of California, Irvine, USA)
• Juan Carlos Idrobo (University of Washington, USA)
• Yuichi Ikuhara (The University of Tokyo, Japan)
• Ryo Ishikawa (The University of Tokyo, Japan)
• Robert Klie (University of Illinois at Chicago, USA)
• James LeBeau (Massachusetts Institute of Technology, USA)
• Hyun-Wook Lee (Ulsan National Institute of Science and Technology, Republic of Korea)
• Xiaonan Luo (Contemporary Amperex Technology Co., Limited, China)
• Andrew Minor (University of California, Berkeley, USA)
• Leopoldo Molina-Luna (Technische Universität Darmstadt, Germany)
• Jungwon Park (Seoul National University, Republic of Korea)
• Mary Scott (University of California, Berkeley, USA)
• Steven Spurgeon (National Renewable Energy Laboratory, USA)
• Eric Stach (University of Pennsylvania, USA)
• Austin Wade (Thermo Fisher Scientific, USA)
• John Watt (Los Alamos National Laboratory, USA)
• Jianguo Wen (Argonne National Laboratory, USA)
• Jong Min Yuk (Korea Advanced Institute of Science and Technology, Republic of Korea)
• Minghao Zhang (The University of Chicago, USA)
• Haimei Zheng (Lawrence Berkeley National Laboratory, USA)
• Yimei Zhu (Brookhaven National Laboratory, USA)

Symposium Organizers

Yaobin Xu

Pacific Northwest National Laboratory

USA

yaobin.xu@pnnl.gov

Shelly Conroy

Imperial College London

United Kingdom

m.conroy@imperial.ac.uk

Seung-Yong Lee

Hanyang University

Republic of Korea

syonglee@hanyang.ac.kr

Zhao Liu

Thermo Fisher Scientific

USA

zhao.liu@thermofisher.com

Link to MRS official symposium website