4 circles, single crystal diffractometer with Kappa geometry, Sapphire2 CCD, low temperature device, Pressure cell, high temperature device
Application: single crystal
Wavelength: Molybdenum K-alpha1
Detector: CCD camera
Powder diffractometer D8
Application: Powder
Wavelength: Copper K-alpha1+2
Detector: Energy sensitive detector
Single crystal camera
Application: Einkristall
Wavelength: Molybdän, silver
Detector: image platte
Guinier camera with high temperature device
Application: powder
Wavelength: Copper K-alpha1
Detector: image platte
Huber Debye Scherrer Camera
Application: Powder
Wellenlänge: Copper
Detektor: image platte
Homemade diffractometer with Bartels monochromator and AMPTEK detector
Application: Single crystal, thin layer
Wavelength: Copper K-Alpha1
Detector: Amptek detector (energy sensitive)
4 circles, single crystal diffractometer with XENOS optics and crystal analyzer
Application: Single crystal, thin layer
Wavelength: Copper K-Alpha1
Detector: Amptek detector (energy sensitive)
Powder samples in a temperature range from 15 K to 700 K
Magnetic field via High Temperature Superconductor Magnet up to 5,5 T
High flux and high resolution options
Application: Powder
Wavelength: Molybdenum K-Alpha1
Detector: MYTHEN detector
The Six-Circle-Diffractometer is suitable for measuring hardly accessible samples, as samples that are mounted in heavy vakuum chambers. Furthermore, experiments with grazing incidence and exit angles are possible. To have a high scattering length, the diffractometer is equipped with a Mo x-ray tube that can be rotated with one motor. The detector can also be moved around two axes, while the sample can be tilted with two motors and rotated around its surface normal.
Application: Single crystal, thin layer
Wavelength: Copper K-Alpha1
Detector: AMPTEK detector (Energy sensitive detector)
200 KV, Imageplatte with 50μm resolution
Diffractometer for texture and residual strain
Powder diffractometer with Goebel mirror and crystal analyzer