Diffractometer / Camera

4 circles, single crystal diffractometer with Kappa geometry, Sapphire2 CCD, low temperature device, Pressure cell, high temperature device

Application: single crystal

Wavelength: Molybdenum K-alpha1

Detector: CCD camera

Powder diffractometer D8

Application: Powder

Wavelength: Copper K-alpha1+2

Detector: Energy sensitive detector

Single crystal camera

Application: Einkristall

Wavelength: Molybdän, silver

Detector: image platte

Powder diffractometer Guinier camera

Application: Powder

Wavelength: Molybdenum K alpha1

Detector: image platte

Guinier camera with high temperature device

Application: powder

Wavelength: Copper K-alpha1

Detector: image platte

Huber Debye Scherrer Camera

Application: Powder

Wellenlänge: Copper

Detektor: image platte

Homemade diffractometer with Bartels monochromator and AMPTEK detector

Application: Single crystal, thin layer

Wavelength: Copper K-Alpha1

Detector: Amptek detector (energy sensitive)

4 circles, single crystal diffractometer with XENOS optics and crystal analyzer

Application: Single crystal, thin layer

Wavelength: Copper K-Alpha1

Detector: Amptek detector (energy sensitive)

Powder samples in a temperature range from 15 K to 700 K

Magnetic field via High Temperature Superconductor Magnet up to 5,5 T

High flux and high resolution options

Application: Powder

Wavelength: Molybdenum K-Alpha1

Detector: MYTHEN detector

The Six-Circle-Diffractometer is suitable for measuring hardly accessible samples, as samples that are mounted in heavy vakuum chambers. Furthermore, experiments with grazing incidence and exit angles are possible. To have a high scattering length, the diffractometer is equipped with a Mo x-ray tube that can be rotated with one motor. The detector can also be moved around two axes, while the sample can be tilted with two motors and rotated around its surface normal.

Application: Single crystal, thin layer

Wavelength: Copper K-Alpha1

Detector: AMPTEK detector (Energy sensitive detector)

Diffractometer for texture and residual strain

Powder diffractometer with Goebel mirror and crystal analyzer