The effective work will involve bulk deformation, structure and property characterizations. Dislocations will be introduced using high-temperature plastic deformation.[3,4] Advanced transmission electron microscope (TEM) will be employed to image the dislocation structures and their orientations. The obtained samples with dislocation networks will be characterized by investigating first and third harmonic dielectric and piezoelectric properties. Especially, local dislocation-domain wall interactions will be studied using piezoresponse force microscope (PFM) and scanning x-ray diffraction microscopy (SXDM) at the European Synchrotron Radiation Facility.
As an MSc student, you will be trained to use the existing state of the art setups including Zwick and Instron, different microscopes as well as basic and dedicated characterization techniques, e.g., structural and ferroelectric measurements.
If you are interested in this topic, please contact: Fangping Zhuo, zhuo@ceramics.tu-…
Expected starting date: as soon as possible, but can be flexible.
Reference:
[1] Hull, D. and Bacon, D. J. Introduction to dislocations. Butterworth-Heinemann, (2001).
[2] Höfling, M., Zhou, X., Zhuo, F., Rödel, J., et al. Science 372, 961 (2021).
[3] Zhuo, F., Rödel, J. et al. Nat. Commun. 13, 6676 (2022).
[4] Zhuo, F., Rödel, J. et al. Phys. Rev. Lett. 13, 01680 (2023).
[5] Zhuo, F. and Rödel, J. Appl. Phys. Lett. 122, 252902 (2023).
[6] Jiang T., Ni F., Zhuo, F., Rödel, J. et al. Appl. Phys. Lett. 123, in publication (2023).