Publikationen 2005

Plasma in einer Vakuumkammer

Publikationen – 2005

P. Erhart, A. Klein, K. Albe
First-principles study of the structure and stability of oxygen defects in zinc oxide
Physical Review B 72, 085213 (2005)

B. Späth, J. Fritsche, A. Klein, W. Jaegermann
p-ZnTe for Back Contacts to CdTe Thin Film Solar Cells
Materials Research Society Symposium Proceedings 865, 299-306 (2005)

W. Jaegermann, A. Klein, J. Fritsche, D. Kraft, B. Späth
Interfaces in CdTe Solar Cells: From Idealized Concepts to Technology
Materials Research Society Symposium Proceedings 865, F6.1 (2005)

B. Jaeckel, R. Fritsche, A. Klein, W. Jaegermann
ZnS deposition onto bare and GaSe terminated Silicon-(111)-surfaces
AIP Conference Proceedings 772, 153-154 (2005)

J. Fritsche, A. Klein, W. Jaegermann
Thin Film Solar Cells: Materials Science at Interfaces
Advanced Engineering Materials 7, 914-920 (2005)

G. Venkata Rao, F. Säuberlich, A. Klein
Influence of Mg content on the band alignment at CdS/(Zn,Mg)O interfaces
Applied Physics Letters 87, 032101 (2005)

D. Ensling, A. Thißen, Y. Gassenbauer, A. Klein, W. Jaegermann
In-situ preparation and analysis of functional oxides
Advanced Engineering Materials 7, 945-949 (2005)

R. Rudolph, C. Pettenkofer, A.A. Bostwick, J.A. Adams, F. Ohuchi, M.A. Olmstead, B. Jaeckel, A. Klein, W. Jaegermann
Electronic structure of the Si(111):GaSe van der Waals-like surface termination
New Journal of Physics 7, 108/1-20 (2005)

E. Wisotzki, A. Klein, W. Jaegermann
Van der Waals condensation of ZnSe on layered GaSe van der Waals surfaces: A new route to self-organized well defined quantum dot structures
Advanced Materials 19, 1173-1177 (2005)

A. Klein, W. Jaegermann, J. Fritsche, R. Hunger, D. Kraft, F. Säuberlich, T. Schulmeyer, B. Späth
Interfaces in Thin Film Solar Cells
Proceedings of the 31st IEEE Photovoltaic Specialists Conference, Orlando, Florida, (2005)

T. Schulmeyer, R. Hunger, R. Fritsche, B. Jäckel, W. Jaegermann, A Klein, R. Kniese, M. Powalla
Interfaces of Chalcogenide Solar Cells: A study of the composition at the Cu(In,Ga)Se2/CdS contact
Thin Solid Films 480-481, 110-117 (2005)

B. Späth, J. Fritsche, F. Säuberlich, A. Klein, W. Jaegermann
Studies of sputtered ZnTe films as interlayer for the CdTe thin film solar cell
Thin Solid Films 480-481, 204-207 (2005)

R. Hunger, T. Schulmeyer, A. Klein, W. Jaegermann, M. Lebedev, K. Sakurai, S. Niki
SXPS investigation of the Cd partial electrolyte treatment of CuInSe2 absorbers
Thin Solid Films 480-481, 218-223 (2005)

R. Alcantara, G. F. Ortiz, P. Lavela, J. L. Tirado, W. Jaegermann, A. Thissen
Rotorblade Grinding and Reannealing of LiCoO2: SEM, XPS, EIS, and Electrochemical Study
J. Electroanal. Chem., 584 (2005) 147

A. Thissen, D. Ensling, F. J. Fernandez Madrigal, W. Jaegermann, R. Alcantara, P. Lavela, J. L. Tirado
Photoelectron Spectroscopic Study of the Reaction of Li and Na with NiCo2O4
Chem. Mater. 17 (2005) 5202

Q.-H. Wu, A. Thissen, W. Jaegermann
Photoelectron spectroscopic study of Li oxides on Li over-deposited V2O5 thin film surfaces
Appl. Surf. Sci., 250 (2005) 57

R. Hunger, R. Fritsche, B. Jäckel, W. Jaegermann, L. Webb, N. S. Lewis
Chemical and electronic characterization of methyl-terminated Si(111) surfaces by high-resolution synchrotron photoelectron spectroscopy
Phys. Rev. B, 72 (2005) 45317

Th. Mayer, M. Lebedev, R. Hunger, W. Jaegermann (review article)
Elementary Processes at Semiconductor/Electrolyte Interfaces: Perspectives and Limits of Electron Spectroscopy
Appl. Surf. Sci. 252 (2005) 31

Q.-H. Wu, M. Liu, W. Jaegermann
X-Ray Photoelectron Spectroscopy of La0.5Sr0.5MnO3
J. Mat. Lett., 59 (2005) 3382

Q.-H. Wu, A. Thißen, W. Jaegermann
Photoelectron Spectroscopic Study of Li Intercalation into V2O5 Thin Film
Surf. Sci., 578 (2005) 203

B. Jaeckel, Y. Gassenbauer, W. Jaegermann, Y.Tomm
AFM Induced Tip Formation of Nanometer Scale Structures on WSe2 under Defined Conditions
Surf. Sci., 597 (2005) 65

W. Jaegermann, Th. Mayer (invited review article)
Water Adsorption on Semiconductor Surfaces
Landolt Börnstein, Vol III/42, A4, H. Bonzel (ed.), (2005), 226-298