Profilometer

Profilometer

Measurement of small height differences via scanning of a sample below a needle with a diamant tip (stylus) as line scans.

Dektak XT Advanced System, with 3D mapping and stitching, on vibration isolation desk

  • Vertical range: 6.5 µm / 65.5 µm / 524 µm / 1 mm
  • Vertical resolution: 1 Å @ 6,.5 µm vertical range
  • Scan length: 55 mm (200 mm with stitching)
  • Horizontal resolution: 120.000 points
  • Stage diameter: 6" (15.2 cm)
  • Stylus force: 1-15 mg
  • Stylus diameter: 2.5 µm, 5 µm, 12.5 µm, 25 µm
  • Data transfer: USB