Publikationen 2006

Plasma in einer Vakuumkammer

Publikationen – 2006

Y. Gassenbauer, R. Schafranek, A. Klein, S. Zafeiratos, M. Hävecker, A. Knop-Gericke, R. Schlögl
Surface potential changes of semiconducting oxides monitored by high-pressure photoelectron spectroscopy: Importance of electron concentration at the surface
Solid State Ionics 177, 3123-3127 (2006)
doi:10.1016/j.ssi.2006.07.036

S.P. Harvey, T.O. Mason ,Y. Gassenbauer, R. Schafranek, A. Klein
Surface vs. Bulk Electronic/Defect Structures of Transparent Conducting Oxides. Part I. Indium Oxide and ITO
Journal of Physics D: Applied Physics 39, 3959-3968 (2006)
doi:10.1088/0022-3727/39/18/006

Y. Gassenbauer, R. Schafranek, A. Klein, S. Zafeiratos, M. Hävecker, A. Knop-Gericke, R. Schlögl
Surface states, surface potentials and segregation at surfaces of tin-doped In2O3
Physical Review B 73, 245312 (2006)
doi:10.1103/PhysRevB.73.245312

P. Erhart, K. Albe, A. Klein
First-principles study of intrinsic point defects in ZnO: Role of band structure, volume relaxation, and finite-size effects
Physical Review B 73, 205203 (2006)
doi:10.1103/PhysRevB.73.205203

R. Schafranek, A. Klein
In-situ photoemission study of the contact formation of (Ba,Sr)TiO3 with Cu and Au
Solid State Ionics 177, 1659-1664 (2006)
doi:10.1016/j.ssi.2006.03.021

Y. Gassenbauer, A. Klein
Electronic and Chemical Properties of Tin-Doped Indium Oxide (ITO) Surfaces and ITO/ZnPc Interfaces Studied In-situ by Photoelectron Spectroscopy
J. Phys. Chem. B, 2006, 110 (10), pp 4793–4801
doi:10.1021/jp056640b

A. Sivasankar Reddy, P. Sreedhara Reddy, S. Uthanna, G. Venkata Rao, A. Klein
Effect of substrate temperature on the physical properties of dc magnetron sputtered Cu2O films
Physica Status Solidi (a) 203, 844-853 (2006)
doi:10.1002/pssa.200521032

A. Klein, T. Schulmeyer
Interfaces of Cu-chalcopyrites, in Wide gap chalcopyrites
edited by S. Siebentritt and U. Rau (Springer-Verlag, Heidelberg, 2006)

F. Rüggeberg, A. Klein
The In2O3/CdTe interface: A possible contact for thin film solar cells?
Applied Physics A 82, 281-285 (2006)
doi:10.1007/s00339-005-3329-7

T. Mayer, U. Weiler, E. Mankel and W. Jaegermann
Bulk sensitization of inorganic semiconductors with organic guest molecules: zink-phthalozyanine embedded into µc-Si and ZnSe host matrices
Proc. 4th World Conference on Photovoltaic Energy Conversion (2006)

T. Mayer, M. Lebedev, R. Hunger, W. Jaegermann
Synchrotron Photoemission Analysis of Semiconductor/Electrolyte Interfaces by the Frozen-Electrolyte Approach: Interaction of HCl in 2-Propanol with GaAs(100)
J. Phys. Chem. B; 110 (2006) 2293
doi:10.1021/jp056375u

U. Weiler, K. Schwanitz, C. Kelting, D. Schlettwein, D. Wöhrle, T. Mayer and W. Jaegermann
Phthalocyanines Incorporated into Hot Wire-CVD Grown Silicon
Thin Solid Films 511-512, (2006) 172
doi:10.1016/j.tsf.2005.12.060

R. Hunger, W. Jaegermann, A. Merson, Y. Shapira, C. Pettenkofer, J. Rappich
Electronic structure of methoxy-, bromo-, and nitrobenzene grafted onto Si(111)
Journal of Physical Chemistry B110 (31) (2006) 15432-15441.
doi:10.1021/jp055702v

C. Kelting, U.Weiler, T.Mayer, W. Jaegermann, S. Makarov, D. Wöhrle, O. Abdallah, M. Kunst, and D. Schlettwein
Sensitization of thin-film-silicon by a phthalocyanine as strong organic absorber
Organic Electronics 7, (2006) 363-368
doi:10.1016/j.orgel.2006.04.003

Q.-H. Wu, A. Thissen, W. Jaegermann
Photoemission spectroscopy and electronic structures of LiMn2O4
Chinese Physics Letters 23, (2006) 2202
doi:10.1088/0256-307X/23/8/066

F. Donsanti, K. Kostourou, F. Decker, N. Ibris, A.M. Salvi, M. Liberatore, A. Thissen, W. Jaegermann, D. Lincot
Alkali ion intercalation in V2O5: preparation and laboratory characterization of thin films produced by ALD
Surface and Interface Analysis 38, (2006). 815
doi:10.1002/sia.2237

Q.-H.Wu, A. Thissen, W. Jaegermann, M. Schuez, P.C. Schmidt
Resonant photoemission spectroscopy study of electronic structure of V2O5
Chemical Physics Letters 430, (2006) 309
doi:10.1016/j.cplett.2006.08.071

T. Deniozou, N. Esser, T. Schulmeyer, R. Hunger
A (4x2) surface reconstruction of CuInSe2 (001) studied by low-energy electron diffraction and soft x-ray photoemission spectroscopy
Applied Physics Letters 88, 052102 (2006)
doi:10.1063/1.2162677