Ausstattung

Plasma in einer Vakuumkammer

Instrumentation

Our main experimental facilities are integrated systems for the preparation of thin films and the analysis of surfaces by photoemission (XPS/UPS), scanning probe techniques (STM/AFM), low energy ion scattering (LEIS) and electron diffraction (LEED). Currently we operate 6 integrated systems:

Furthermore we use electric and dielectric analysis techniques. In exchange, we also use the equipment of other groups of Materials Science.

Additional equipment