Antti Tolvanen

Dr. Antti Tolvanen

+49 6151 16-6323
+49 6151 16-6263

Jovanka-Bontschits-Str. 2
64287 Darmstadt

Office: L1|08 213


Computational methods in materials science: Atomistic simulations.


Physics/ Materials Science:

O. Lehtinen, J. Kotakoski, A. V. Krasheninnikov, A. Tolvanen, K. Nordlund and J. Keinonen: Effects of ion bombardment on a two-dimensional target: atomistic simulations of graphene irradiation, Phys. Rev. B 81, 153401 (2010).

Julio. A. Rodríguez-Manzo, Antti Tolvanen, Arkady V. Krasheninnikov, Kai Nordlund, Arnaud Demortière and Florian Banhart: Defect-induced junctions between single- or double-wall carbon nanotubes and metal crystals, Nanoscale 2, 901 (2010).

A. Tolvanen, A. V. Krasheninnikov, A. Kuronen, K. Nordlund: Effect of iron nanoparticle geometry on the energetics of carbon interstititals, Phys. Status Solidi C 4, 1274 (2010).

J. A. Rodríguez-Manzo, I. M. Janowska, C. Pham-Huu, A. Tolvanen, A. V. Krasheninnikov, K. H. Nordlund and F. Banhart: Growth of Single-Walled Carbon Nanotubes from Sharp Metal Tips, Small 5, 2710 (2009).

A. Tolvanen, G. Buchs, P. Ruffieux, P. Groning, O. Groning, and A.V. Krasheninnikov: Modifying the electronic structure of semiconducting carbon nanotubes by Ar ion irradiation, Phys. Rev. B 79, 125430 (2009).

A. Tolvanen, J. Kotakoski, A. V. Krasheninnikov, K Nordlund: Relative abundance of single and double vacancies in irradiated single-walled carbon nanotubes. Appl. Phys. Lett. 91, 173109 (2007).

Computer science:

Tolvanen, A., Perwass, C., Sommer, G.: Projective model for central catadioptric cameras using Clifford algebra. In 27. Symposium für Mustererkennung, DAGM 2005, Wien, 29.8.-2.9.2005, LNCS Series, Vol. 3663, Springer-Verlag, Heidelberg, Berlin, pp. 192-199, 2005.

Gebken, C. Tolvanen, A. Sommer, G.: Perspective Pose Estimation from Uncertain Omnidirectional Image. In Proc. 18th International Conference on Pattern Recognition, ICPR 2006, August 20-24, Hong-Kong, vol.1, pp. 793-796, 2006.

Gebken, C. Tolvanen, A. Sommer, G.: Pose Estimation from Uncertain Omnidirectional Image Data Using Line-Plane Correspondences. In Proc. DAGM 2006, 28. Symposium für Mustererkennung, Berlin, Sept. 2006, K. Franke et al., editors, Pattern Recognition, LNCS 4174, pp. 587-596, Springer-Verlag, Berlin, Heidelberg, 2006.

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