In-situ Electron Microscopy
The aim of our research is to correlate synthesis and processing of materials with properties and device function through their atomic, nano and micro scale structure in order to provide a knowledge base for tailoring new materials.
We are using state-of-the-art imaging, spectroscopy and diffraction based electron microscopy techniques, both in-situ and ex-situ, to understand materials and provide a link to simulations. When state-of-the-art techniques do not provide sufficient answers, we tackle research problems by dedicated method developments.
We are currently focusing on three main methodology areas for in-situ functional and quantitative materials characterization.
We are applying state-of-the-art electron microscopy techniques such as (S)TEM, EELS, EDX, NBED, tomography and FIB as well as our own developments to characterize materials in a wide range of application areas.