Profilometer Dektak XT Advanced System
Advanced System (with 3D mapping and stitching) allows measurements of small height differences via scanning of a sample below a needle with a diamant tip (stylus) as line scans.
Device Specifications
Vertical range | 6.5 µm / 65.5 µm / 524 µm / 1 mm |
Vertical resolution | 1 Å @ 6,.5 µm vertical range |
Scan length | 55 mm (200 mm with stitching) |
Horizontal resolution | 120.000 points |
Stage diameter | 6" (15.2 cm) |
Stylus force | 1-15 mg |
Stylus radius | 2.5 µm, 5 µm, 12.5 µm, 25 µm |
Data transfer | USB |